Technical Program Committee › Technical Program Committee › Reviewers Tuomas Aura, Microsoft Research Ltd, Cambridge, UK Jean Baronas, Sony Electronics, Inc., USA Ed Barrett, Sony Electronics, Inc., USA David Bateman, Motorola Labs, USA Benny Bing, Georgia Institute of Technology, USA Roland Bless, University of Karlsruhe, Germany Maarten Bodlaender, Philips Research Lab, Netherlands Philippe Boucachard, Canon Research Center, France Torsten Braun, Universitaet Bern, Switzerland Wolfgang Budde, Philips Research Lab, Germany Georg Carle, Universitaet Tuebingen, Germany Kiran Challapali, Philips Research Laboratories, Germany Rajarathnam Chandramouli, Stevens Institute of Tech., USA Jon Crowcroft, University of Cambridge, UK Jianyu Dong, California State Univ. LA, USA Stefan Dresler, E-Plus Mobilfunk, Germany Ahmet M.Eskicioglu, CUNY Brooklyn College, USA Mark Fidler, HP-Roseville, USA Mario Marques Freire, University of Beira Interior, Portugal David J Greaves, University of Cambridge, UK Howard Green, Marconi, UK Richard S. Hall, Domain University, Grenoble, France Kalva Hari, Florida Atlantic University, USA Marty A.Humphrey, University of Virginia, Charlottesville, USA Alan Kaplan, nic Information and Networking Technologies Lab, USA Roger George Kermode, Motorola Laboratories Graham N C Kirby, University of St Andrews, UK Paul J.Kuehn, Universitaet, Stuttgart, Germany Jung-Tao Liu, Lucent Technologies, USA Carl Mansfield, Sharp Labs, USA Dave Marples, Telcordia Technologies, USA Madjid Merabti, John Moores Univ, Liverpool, UK Hiroyuki Morikawa, Communications Research Laboratory Stanley Moyer, Telcordia Technologies, USA Guenter Mueller, Universitaet Freiburg, Germany Naohisa Ohta, Sony, Japan Algirdas Pakstas, London Metropolitan University, UK Giovanni Pau, UCLA, USA Garry Paxinos, Metro Link, USA Hartmut Ritter, Freie Universitaet Berlin, Germany Marco Roccetti, University of Bologna Italy Pablo Rodriguez, Microsoft Research in Cambridge, UK Ahmed Safwat, Queen's University, Canada Zafer Sahinoglu, Mitsubishi Electric Research Labs, USA Paola Salomoni, University of Bologna, Italy Jochen H Schiller, Freie Universit‰t Berlin, Germany Jochen Seitz, Technische Universitaet Ilmenau, Germany James T Smith, Institute for Scientific Research, Inc., USA Bhupinder Sran, DeVry College of Technology, USA Burkhard Stiller, ETH Zuerich, Switzerland Suba Subbalakshmi, Stevens Institute of Tech., USA Samir Tohme, ENST Paris, France Alexandros Tourapis, Thomson Corporate Research, USA Petri Vuorimaa Helsinki, University of Technology, Finland Klaus Wehrle, ICSI, Berkeley, CA, USA Jack C. Wileden, University of Massachusetts Amherst, USA Alexander L. Wolf, University of Colorado at Boulder, USA Wayne Wolf, Princeton University, USA Ouri Wolfson, University of Illinois, USA Dapeng Wu, University of Florida, USA Peng Yin, Thomson Corporate Research, USA Heather Yu, Panasonic Information and Networking Technologies Lab, USA Reviewers Omar Abuelma'atti, John Moores University, Liverpool, UK Gregory Aist, NASA Ames Research Center., USA Fil Alleva, Microsoft Speech Research Group, USA Bob Askwith, Liverpool John Moores University, UK Kin Wing Au, Hong Kong Applied Science and Technology Research Institute Company Limited, Hong Kong Leonardo Badia, University of Ferrara, Italy Florian Baumgartner, University of Bern, Switzerland Pierpaolo Bergamo, University of California Los Angeles, USA Larry Bernstein, Stevens Institute of Technology, USA Paola Bisaglia, University of Padova, Italy Subir Biswas, Michigan State University, USA Luciano Bononi, University of Bologna, Italy Timothy X Brown, University of Colorado at Boulder, USA Veronique Buzenac, Motrola Centre de Recherche Paris, France Vincenzo Cacace, STMicroelectronics, Italy Stefano Cacciaguerra, University of Bologna, Italy Alain Caillerie, Canon, Inc., Japan Amer Catovic, University of Sarajevo, Bosnia and Herzegovina Emre Celebi, Polytechnic University, USA Andy Chang, Hong Kong University of Science & Technology, Hong Kong Huamin Chen, University of California, Davis, USA Pi-Chun Chen, Lucent Technologies, USA Qingyu Chen, Stevens Institute of Technology, USA Shigang Chen, University of Florida, USA Yingwei Chen, Philips Research, USA Yung-Fang Chen, National Central University, Republic of China Fang-Chen Cheng, Bell Labs, Lucent Technologies, USA Terence Cheung, City University of Hong Kong, Hong Kong Dong-Ho Cho, Korea Advanced Institute of Science and Technology, Republic of Korea Gabriella Convertino, STM Microelectronics, Italy Johnas Cukier, Mitsubishi Electric Research Laboratories, USA Francesc Dalmases, Philips Research Laboratories, Germany Lorena Dal Monte, Universita' di Bologna, Italy Marc Danzeisen, University of Bern, Switzerland Davide Dardari, University of Bologna, Italy Budhaditya Deb, Rutgers University, USA Hongmei Deng, University of Cincinnati, USA Jing Deng, University of Colorado, USA Zhenhai Duan, Florida State University, USA Paul Fergus, John Moores University, Liverpool, UK Alberto Fernandes, Univ of Cambridge., UK Stefano Ferretti, University of Bologna, Italy Gerald Friedland, Free University Berlin, Germany Egbert Fridrich, University of Tuebingen, Germany Marco Furini, University of Piemonte Orientale, Italy Zhigang Gao, The Ohio State University, USA Jose-Esteban Garcia, University of Hannover, Germany Sachin Garg, Avaya Labs, USA Vittorio Ghini, University of Bologna, Italy Sumathi Gopal, Rutgers University, USA Jeremy Gosteau, Motorola Labs, France Denis Gracanin, Virginia Tech, USA Jarno Guidi, Philips Research, The Netherlands Ajay Gupta, Western Michigan University, USA Mohammad Haleem, Stevens Institute of Technology, USA Richard Han, University of Colorado at Boulder, USA Hossam Hassanein, Queens University, Canada Qi He, Carnegie Mellon University, USA Tian He, University of Virginia, USA Lex Heerink, Philips Research, The Netherlands Marc Heissenbuettel, University of Bern, Switzerland Marko Hennhoefer, Ilmenau University of Technology, Germany Xiaoyan Hong, University of California at Los Angeles, USA Gurudutt Hosangadi, Lucent Technologies, USA ChingYao Huang, National Chiao Tung University, Republic of China Abir Hussain, John Moores University, Liverpool, UK David Hwang, UCLA, USA Kazuhito Ikemoto, Sony Corp., Japan Tatsuo Itabashi, ita3@computer.org, Japan Holger Karl, Technical University Berlin, Germany Jaehyung Kim, Lucent, USA Graham N. C. Kirby, University of St Andrews, UK Jiejun Kong, University of California at Los Angeles, USA Larry Korba, National Research Council of Canada, Canada Cenk Kose, University of California, Los Angeles, USA Patrick Labbe, Motorola Centre de Recherche Paris, France Jung Lee, Lucent Technologies, USA Scott Lee, University of California at Los Angeles, USA Sungwook Lee, UCLA, USA Shawmin Lei, Sharp Labs, USA Tieyan Li, National University of Singapore, Singapore Yang Li, Stevens Institute of Technology, USA Yujin Lim, University of California Los Angeles, USA Wanrong Lin, Panasonic, USA Wei Liu, University of Florida, USA Joan Llach, Thomson Inc., USA Flavio Lorenzelli, STMicroelectronics, USA Haiyun Luo, University of California at Los Angeles, USA Dario Maggiorini, University of Milano, Italy Ajay Mahimkar, University of Texas at Austin, USA Hong Man, Stevens Institute of Technology, USA Stefan Mangold, Philips Research, USA Daniela Maniezzo, University of California, Los Angeles, USA Shiwen Mao, Polytechnic University, USA Reza Mardani, Lucent Technologies, USA Saurabh Mathur, Thomson Inc. Corporate Research, USA Maja Matijasevic, FER, Univ. of Zagreb, Croatia Satoru MATSUDA, smatsuda@net.sony.co.jp Marcin Michalak, University of Bern, Switzerland Miodrag Mihaljevic, Sony, Japan Anirach Mingkhwan, Liverpool John Moores University, UK Silvia Mirri, University of Bologna, Italy Shivakant Mishra, University of Colorado at Boulder, USA Sam Mo, Panasonic Technologies, USA Danilo Montesi, Universit‡ di Camerino, Italy Sai Shankar Nandagopalan, Philips Research, USA Sathya Narayanan, Panasonic Research, USA Nidal Nasser, Queen's University, Canada Heiko Niedermayer, University of Tuebingen, Germany Ricardo Oliveira, UCLA, USA Ruy de Oliveira, University of Bern, Switzland Philip Orlik, Mitsubishi Electric, USA Mustafa Ozdemir, Northeastern University, USA Claudio Palazzi, University of Bologna, Italy Panagiotis Papadimitratos, Cornell University, USA Vasilis Papageorgiou, London Metropolitan University, United Kingdom Joon-Sang Park, University of California, Los Angeles, USA Krishna Paul, Indian Institute of Technology, Bombay, India Greg Perkins, Panasonic Technologies, USA Javier del Prado, Philips Research, USA Huang Qiang, Princeton University, USA Venkatesh Rajendran, University of California, Santa Cruz, USA Ramachandran Ramjee, Bell Labs, Lucent Technologies, USA Gagan Rath, IRISA-INRIA, France, France Alexandre Ribeiro Dias, Motorola Centre de Recherche Paris, France Guido Riva, Fondazione Ugo Bordoni, Italy Matteo Roffilli, University of Bologna, Italy Zack Rubinstein, Univ. of New Hampshire, USA Patrick Schaumont, University of California, Los Angeles, USA Matthias Scheidegger, University of Bern, Switzerland Tarek Sheltami, University of Ottawa, Canada Hiroyuki Shiba, NTT, Japan Curtis Siller, Cetacean Networks, USA Sebastien Simoens, Motorola Centre de Recherche, France Sasa Slijepcevic, University of California at Los Angeles, USA James T. Smith, Institute for Scientific Research, Inc., USA Bhupinder Sran, DeVry College of Technology, USA Hsuan-Jung Su, National Taiwan University, Republic of China Stefano Tomasin, University of Padova, Italy Snigdha Verma, Thomson Inc., USA Deanna Wilkes- Gibbs, Panasonic Technologies, USA Joseph Williams, Sun Microsystems, USA Dicky Wong, Hong Kong University of Science & Technology, Hong Kong Peter Hon Wah Wong, Hong Kong University of Science & Technology, Hong Kong Christos Xenakis, University of Athens, Greece Kaixin Xu, University of California, Los Angeles, USA Satoshi YAMAMORI, yamamori@mobileds.jp, Japan Kenji Yamane, Sony Corp., Japan Jong-Chul Ye, Philips Research, USA Seung Yi, University of Illinois at Urbana-Champaign, USA Yunjung Yi, University of California, at Los Angeles, USA Yifei Yuan, Lucent Technologies-Bell Lab Innovations, USA Song-Lin Young, Sharp Labs, USA Surong Zeng, Mesh Networks, USA Wenfeng Zhang, Rutgers University, USA Yanchao Zhang, University of Florida, USA Yi Zhao, The Ohio State University, USA Sencun Zhu, George Mason University, USA